NS-ZnS:Mn, ZnS:Mn/Si3N4 multilayers with thicknesses of 1.9– 3.5 nm for ZnS were prepared by a rf-magnetron sputtering method. From the results of grazing incidence X-ray reflectometry and X-ray diffractmetry, formation of ZnS:Mn nanocrystals in the ZnS

We have developed a new type of a thin-film electroluminescence (TFEL) device with nanostructured (NS)-ZnS:Mn utilizing its enhanced luminescent efficiency due to the quantum confinement (QC) effects. As NS-ZnS:Mn, ZnS:Mn/Si3N4 multilayers with thicknesses of 1.9– 3.5 nm for ZnS were prepared by a rf-magnetron sputtering method. From the results of grazing incidence X-ray reflectometry and X-ray diffractmetry, formation of ZnS:Mn nanocrystals in the ZnS layers are confirmed. With a decrease in the ZnS:Mn layer thickness, the photoluminescence (PL) efficiency associated with the Mn2+ transitions is increased, and the PL excitation spectrum is shifted toward higher energies, indicating appearance of the QC effects. As the results of the application of NS-ZnS:Mn to the emission layer of the TFEL device, we have successfully observed reddish-orange emission above the threshold voltage of 12 V0-p, and the maximum luminance is 3.0 cd/m2 operated with the 1-kHz sinusoidal voltage of 20 V0-p.